Журнал: Materials Science in Semiconductor Processing

Импакт-фактор журнала
2.22
SJR журнала
0.65

Papers

Impact Factor

Scientific Journal Ranking

2019

2.
Study of SiC buffer layer thickness influence on photovoltaic properties of n-GaN NWs/SiC/p-Si heterostructure
Shugurov K.Y.
Reznik R.R.
Mozharov A.M.
Kotlyar K.P.
Koval O.Y.
Osipov A.V.
Fedorov V.V.
Shtrom I.V.
Bolshakov A.D.
Kukushkin S.A.
Мухин Иван
Cirlin G.E.
Materials Science in Semiconductor Processing
 , vol.
90
 , pp.
20-25
 , 2019
[DOI:
10.1016/j.mssp.2018.09.024
 ] [IF:
2.220
 , SJR:
0.645
 ]

2016

1.
Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates
Neplokh V.
Ali A.
H. F.
Foldyna M.
Мухин Иван
Cirlin G.
Harm Jean_Christophe
Gogneau No?lle
Tchernycheva Maria
Materials Science in Semiconductor Processing
 , vol.
55
 , pp.
72–78
 , 2016
[DOI:
10.1016/j.mssp.2016.03.002
 ] [IF:
2.220
 , SJR:
0.645
 ]