Журнал: Materials Science in Semiconductor Processing
Импакт-фактор журнала
2.22
SJR журнала
0.65
Papers
Impact Factor
Scientific Journal Ranking
2019
2.
[DOI:
10.1016/j.mssp.2018.09.024
]
[IF:
2.220
, SJR:
0.645
]
2016
1.
Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates
[DOI:
10.1016/j.mssp.2016.03.002
]
[IF:
2.220
, SJR:
0.645
]